JEOL NeoScope Benchtop SEM Demo

A demonstration of the JEOL/Nikon NeoScope (JCM-5000) is being held at the Research Centre for Surface and Materials Science (RCSMS) next week (March 8-11). This would be a good time for those that use or wish to use scanning electron microscopy (SEM) to see how a benchtop system could complement the use of optical microscopy and high resolution SEM.

For those new to benchtop SEMs – please see the JEOL website.

A open house style workshop will be hosted by Melanie Kennerly of Coherent Scientific on Tuesday, March 8th from 10am-noon in the AFM room of RCSMS. Interested user should try to attend this session.

You will also be able to book times to try the instrument on your own samples – please send an email to b.wright@auckland.ac.nz to arrange a time (Tuesday  through Friday, 9AM to 4PM).